Enhanced phase noise modeling of fractional-N frequency synthesizers

H. Arora;N. Klemmer;J.C. Morizio;P.D. Wolf

DOI

Charge pump (CP);delta–sigma;dynamic mismatch;dynamic mismatch corner frequency;flicker noise;flicker noise corner frequency;fractional-N frequency synthesizer (Frac-N);frequency synthesizer;gain mismatch;gain mismatch corner frequency;phase frequency detector (PFD);phase noise;reset delay mismatch;rms phase error;spurs;thermal noise;voltage-controlled oscillator (VCO) IEEE Transactions on Circuits and Systems I: Regular Papers;2005;52;2;10.1109/TCSI.2004.841594

Published: Jan 31, 2005

Description:

IEEE Transactions on Circuits and Systems I: Regular Papers;2005;52;2;10.1109/TCSI.2004.841594