理工书库 lilin | Category: 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512);2004;1; ;10.1109/ISCAS.2004.1328296

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应用随机过程概率论模型导论 (Sheldon M.Ross) (Z-Library)

应用随机过程概率论模型导论 (Sheldon M.Ross) (Z-Library)

数值分析第五版 (李庆扬王能超易大义) (z-lib.org)

数值分析第五版 (李庆扬王能超易大义) (z-lib.org)

IEEE Std 802.11ac™-2013, IEEE Standard for Information technology—Telecommunications and information exchange between systems—Local and metropolitan area networks—Specific requirements—Part 11: Wireless LAN Medium Access Control (MAC) and Physical Layer (PHY) specifications—Amendment 4: Enhancements for Very High Throughput for Operation in Bands below 6 GHz

IEEE Std 802.11ac™-2013, IEEE Standard for Information technology—Teleco[..] ...

LAN/MAN Standards Committee of the IEEE Computer Society

CN106357266B-华为2016-锁定检测电路、方法及锁相电路-带offset电流

CN106357266B-华为20[..]

相位噪声jitter基本定义

相位噪声jitter基本定义

一种高精度的CMOS带隙基准电压源

一种高精度的CMOS带隙基准电压源

Verilog数字VLSI设计教程

Verilog数字VLSI设计教程

【作者】李林编著

一种大电流LDO稳压器的设计

一种大电流LDO稳压器的设计

Microsoft Word - I2C×ÜÏß¹æ·¶.doc

Microsoft Word - I2C×ÜÏß¹æ·¶.doc

Session 7: Imagers and Range Sensors

Session 7: Imagers and Range Sensors

US6380806B1-Differential telescopic operational amplifier having switched capacitor common mode feedback circuit portion

US6380806B1-Diffe[..] telescopic operational amplifier having ...

(EE) Razavi, Design of Analog CMOS Integrated Circuits 2nd

(EE) Razavi, Design of Analog CMOS Integrated Circuits 2nd

Calibre® DefectReview User's Manual

Calibre® DefectReview User's Manual

Siemens Industry Software

一种带过温保护和折返电流限的LDO设计

一种带过温保护和折返电流限的LDO设计

eetop.cn Matching

eetop.cn Matching

模拟集成电路信号完整性中抖动与振铃问题的研究

模拟集成电路信号完整性中抖动与振铃[..]

lnaDesign2

lnaDesign2

mssc.2015.The StrongARM Latch

mssc.2015.The StrongARM Latch

Category: 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512);2004;1; ;10.1109/ISCAS.2004.1328296

Design of class AB output stages using the structural methodology

Design of class AB output stages using the structural methodology

V. Ivanov & I. Filanovsky